microscopie à balayage

CONT: Microscopie électronique à balayage. Les microscopes électroniques à balayage (MEB) utilisent un faisceau d'électrons balayés hautement énergétique pour examiner la surface d'un échantillon.

CONT: In scanning electron microscopy (SEM), a fine probe of electrons with energies typically up to 40 keV [kiloelectron volts] is focused on a specimen, and scanned along a pattern of parallel lines. Various signals are generated as a result of the impact of the incident electrons, which are collected to form an image or to analyse the sample surface. These are mainly secondary electrons, with energies of a few tens of eV [electron volts], high-energy electrons backscattered from the primary beam and characteristic X-rays.

OBS: SEM por sus siglas en inglés.